High-Precision Laboratory Standard Voltage Transformer Solution Solusyon sa High-Precision Laboratory Standard Voltage Transformer

Ⅰ. Technical Focus: Traceability to Metrological Standards
Ang solusyon kini nga gitumong sa nasodnong sistema sa metrology para sa elektrikong enerhiya, gamiton ang independyenteng kontroladong chain sa traceability aron masiguro nga ang resulta sa pagsukol sa voltage mahimong direkta nga ma-trace han International System of Units (SI). Sa pag-eliminar sa cascading errors nga natural sa tradisyonal nga mga device sa pagsukol, hatag kini og reference-grade na kapabilidad sa pagsukol sa voltage para sa advanced nga mga laboratory.

Ⅱ. Core Technical Innovations
Dual-Stage Voltage Transformer Error Compensation Structure
• Gamiton ang dual closed-loop design uban primary + compensation windings, dynamic offsetting sa excitation current ug leakage reactance effects pinaagi sa real-time reverse magnetic flux cancellation. Kini lisud sa theoretical accuracy limits sa single-stage transformers.
• Accuracy sa compensation winding: ±0.5 ppm, enabling automatic nonlinear error correction across a wide range (1%–120% Un).

• Thermostatic Oil-Immersion Temperature Control System
  • Puno sa high-stability synthetic ester insulating oil (thermal expansion coefficient <100 ppm/°C).
  • Triple-stage semiconductor temperature control:
  • Precision sa temperatura sa oil: 55±0.05°C (exceeding ±0.1°C requirement)
  • Temperature gradient: <0.3°C axial variation across windings
  • Thermal time constant >8 hours; daily drift <0.01°C.
• Ultra-Low TCR Quartz-Substrate Voltage Divider Resistors
  • Resistive elements on fused quartz substrate (CTE=0.55 ppm/°C).
  • Laser-trimmed thin-film metal resistors (NiCrAl alloy):
  • Temperature coefficient (TCR): <0.05 ppm/°C (tested average)
  • Voltage coefficient (VCR): <0.02 ppm/V
  • Annual aging rate: <3 ppm

Ⅲ. Application Scenarios
• National metrology institute voltage standards
• Power monitoring for chip manufacturing equipment (e.g., 0.1nm-resolution etchers)
• Precision certification of magnetic confinement power supplies in fusion devices
• Reference resistivity measurements for novel semiconductor materials