Experimentum Functionale Dispositivorum Protectionis Microcomputer: Verificatio Praestantiae et Fidentiae Protectionis
1. Instrumentorum Testandorum Selectio
Principales instrumenta testandi pro dispositivis protectionis microcomputer sunt: tester protectionis microcomputer, generator currentis triphasici, et multimeter.
Ad testandum dispositiva protectionis microcomputer altae tensionis, commendatur uti tester protectionis microcomputer qui potest simul emittere tensionem triphasica et currentem triphasicum, et praeterea sit instructus functione temporali pro ingressis digitalibus.
Ad testandum dispositiva protectionis microcomputer bassae tensionis, si signum sampling currentis traditur ad dispositivum protectionis per transformator currentis (CT), tester protectionis microcomputer uti potest. Si tamen signum sampling currentis directe traditur ad dispositivum protectionis per sensor proprium, generator currentis triphasicus utendus est ad applicandum currentem testandi in latere primum.
2. Praecautiones in Tempore Testandi
Instrumentum testandi et cabinet idem debent esse terra firmiter connecta, ut dispositivum protectionis microcomputer et tester communem terram habeant.
Non inserito vel removeto modulos dispositivi, neque tangito circuitos tabularum, dum dispositivum protectionis microcomputer energizatum est aut in tempore testandi. Si substitutio modulem necessaria est, prius deenergizare oportet, externam potentiam testandi disjungere, et personale statum staticum exonerare aut brachiale antistaticum indutum esse ante procedendum.
In tempore testandi, numquam accidit ut alta tensio ad terminales bassae tensionis vel communicationis applicetur dum conductores testandi mutantur.
Selectio puncti testandi debet accurata esse. Conductores tensionis et currentis a tester non debent directe ad terminales dispositivi protectionis connecti, sed ad latus primum transformatorum instrumentorum. Hoc permittit evaluari attenuationem signi in acquisitione et certificat integritatem testandi.
3. Praeparationes Ante Testandum
Diligenter lege manuale dispositivi protectionis microcomputer vel proceduram testandi. Verifica concordiam inter manuale, nomenplate dispositivi, diagrammata reales connectionis, et rationes transformatorum systematis tensionis et currentis.
Diligenter lege manuale tester protectionis microcomputer et effice te peritus in operatione eius ante testandum. Vitem operatio incorrecta quae dispositivum protectionis subiectum posset superiore tensioni vel currenti, quod damnum causare potest.
Firmare omnes claviculos et modulos quick-connect dispositivi protectionis ut connectiones fideles sint.
Accede ad menu protectionis ad ponendas setting values. Plene intellege significatum cuiusque setting value, organiza et rotula folium setting pro facile verificatione postea.
4. Calibratio Circuitus AC
Applica currentem testandi in latere secundo CT in cabinet secundum diagramma connectionis. Signa et conserva claviculos extractos recte. Testatio analoga tensionis fieri potest in terminal blocks, sed cave ne tension propagetur ad busbars.
Regula magnitudinem et phasem tensionis et currentis in tester. Post applicationem valorem testandi, registra valores sampling display in LCD dispositivi et valores actuales a tester. Error inter duo debet esse minus ±5%. Registra data in tribus punctis: ascendente (0%, 50%, 100%) et descendente (100%, 50%, 0%). Valores display non debent significantem differentiam inter tests ascendentes et descendentes ostendere. Uti formatum tabulae sequens pro registratione.
5. Verificationes Ingressorum/Egressorum Digitalium (DI/DO)
Verificationes ingressorum/egressorum digitalium debent simul cum testibus functionalibus fieri.
5.1. Verificatio Ingressi Digitalis (DI)
Ingressi digitalis dispositivorum protectionis microcomputer continent duas species. Prima est ingressi contactuum duri—contactus externi directe connecti ad dispositivum. Cum contactus externus clauditur, signalis definitus apparet in display. Secunda est ingressi contactuum moli—responsum logicum internum, sicut signalis "overcurrent trip" in panello display quando evenit fault overcurrent.
Verificationes DI debent singillatim secundum diagrammata fieri. Opera equipmenta associata ad mutandum status contactuum. Status display in LCD vel indicatoribus cabinet debet mutari convenienter. Ad certificandam operationem fidem, unusquisque ingressus digitalis debet testari saltem ter.
Numquam simula clausuram contactus directe in terminales backplane dispositivi protectionis. Solum quando systema non displayt vel incorrecte displayt status equipmenti, simulationem terminalem uti oportet ad determinandum an defectus sit in dispositivo protectionis, wiring, vel equipmento.
5.2. Verificatio Egressi Digitalis (DO)
Egressi contactuum dividuntur in species duras et molis. Status DO durus mensurari potest per multimeter. Mutatio status DO moli debet iudicari ex comportamento logico.
5.3. Verificationes Signalium Digitalium
Verificatio Contactus Signalis Alarum: Simula defectus correspondentes secundum logicam. Si alarma expectatur sed non displaytur vel incorrecte, dispositivum est defectuosum. Exempli gratia, simulando defectum PT fuse debet resultare "PT fuse failure alarm" in LCD, illumination LED "Alarm," et activation "Signal Relay." Contactus signalis alarum sunt momentanei.
Verificatio Contactus Signalis Trip: Contactus signalis trip sunt contactus moli. Post actionem protectionis trip, LCD debet display "xx protection trip," CPU illuminare LED "Trip," et activare "Trip Signal Relay" correspondens. LED trip et contactus centralis signalis sunt latching (maintained).
Verificatio Contactus Egressionis Trip: Contactus egressionis trip sunt contactus duri. Post actionem trip, dispositivum protectionis activat relay egressionis trip, claudens contactus egressionis trip. Hi contactus sunt latching (maintained).
6. Testatio Functionum Protectionis
Testatio functionum protectionis est nucleus testationis dispositivorum protectionis microcomputer, focus in verificanda setting values correcta, tempora trip, et performance egressionis.
Testatio Protectionis Definitae Temporis
Methodus Approachi: Disable other protection functions to prevent false tripping. Set the time delay to 0s. Use the tester to approach the set trip value in 0.1A steps until the device issues a trip command. Record the actual operating value, which should be within ±5% of the set value. Then set the time delay to the specified value and apply the recorded actual operating value. The measured trip time should also be within ±5% of the set time.
Methodus Fixed-Value: Disable other protections. Apply 0.95×, 1.05×, and 1.2× the set trip value. Protection should not operate at 0.95×, must operate at 1.05×, and trip time should be tested at 1.2×. The measured time should be within ±5% of the set time.
6.2. Testatio Protectionis Inversae Temporis
Disable other protections. Apply a test value corresponding to a point on the inverse-time curve. Measure the protection operation time and compare it with the theoretical time calculated from the formula. The error should be within ±5%. It is recommended to test at five different points.
Post-Test Verification
Verify Setting Values: Due to frequent enabling/disabling during testing, confusion may occur. After completing all tests, two personnel should jointly verify all settings.
Restore Removed Wiring: Restore all disconnected wires according to drawings or markings, ensuring correct reconnection. When restoring current circuits, avoid reversing CT polarity or connecting protection wires to measurement circuits.
Check Terminal Block Links: Reconnect any opened links on terminal blocks and have them inspected by a designated person. Even if connected, tighten with a screwdriver to prevent loose connections.
Tighten All Core Wire Terminals: To prevent loosening during testing, all wire terminals must be re-tightened after testing to ensure secure crimping.
