Yadda Yana Kula Masu Gate Leakage?

Karamin Gate Leakage

Karamin gate leakage yana nufin karamin karamin kwayoyi da ke faruwa daga gate zuwa source ko drain a cikin Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) ko wasu abubuwan da dama. Gate leakage wani muhimmin paramita don bincike zan iya amfani da shi da tattalin bayanai da idan kanta, musamman a fannin karamin tsari da na inganci. Ga wasu hanyoyi da kiyoyi na karamin gate leakage:

1. Amfani Da Aiki Na Karamin Kwayoyi (Picoammeter)

Aiki na karamin kwayoyi (kamar Keithley 6517B Electrometer/Picoammeter) suna iya karamin kwayoyi masu kadan kuma suna daidai don karamin gate leakage.

Hanyoyi:

Yadda ake Yi Kirkiro Kirkiro: Tabbatar da kana da aiki na karamin kwayoyi mai kyau ta aiki da jirgin kwayoyi da Device Under Test (DUT).

Saki Tsarin:

Saki gate na DUT zuwa wahon gida na aiki na karamin kwayoyi.

Saki wahon gida na aiki na karamin kwayoyi zuwa ground (na biyu source).

Idan an bukata, saki jirgin kwayoyi a kan gate da aiki na karamin kwayoyi don samun jirgin gate da ya kamata.

• Gargadi Aiki Na Karamin Kwayoyi: Gargadi aiki na karamin kwayoyi zuwa sauka mai kyau (na biyu a nanampere ko picampere range) kuma tabbatar da saukarren sa ta daidai don karamin kwayoyi masu kadan.

• Samun Jirgin Tsari: Amfani da jirgin kwayoyi na kan waɗanda ba a cikin aiki na karamin kwayoyi don samun jirgin gate da ya kamata.

• Raketa Rakaicin Kwayoyi: Tabbatar da rakaicin aiki na karamin kwayoyi kuma raketa kwayoyin gate leakage.

2. Amfani Da IV Curve Tracer

IV curve tracer yana iya amfani don karkashin alaka daga kwayoyi zuwa jirgin tsari, tare da taimakawa don bincike gate leakage a jihohin jirgin tsari.

Hanyoyi:

• Yadda ake Yi Kirkiro Kirkiro: Saki IV curve tracer zuwa gate, source, da drain na DUT.

• Gargadi IV Curve Tracer: Zabi sauka mai kyau da saukarren kwayoyi.

• Samun Jirgin Tsari Da Raketa Bayanan: Fadada samun jirgin gate kafin raketa bayanan kwayoyin leakage.

• Bincike Bayanan: Ta hanyar karkashin IV curve, za a iya nuna alaka gate leakage zuwa jirgin tsari.

3. Amfani Da Semiconductor Parameter Analyzer (SPA)

Semiconductor parameter analyzer (kamar Agilent B1500A) wani aiki mai mahimmanci don bincike bayanan abubuwan da suka da shi da semiconductors kuma yana iya karamin kwayoyin gate leakage daidai.

Hanyoyi:

• Yadda ake Yi Kirkiro Kirkiro: Saki semiconductor parameter analyzer zuwa gate, source, da drain na DUT.

• Gargadi Parameter Analyzer: Gargadi sauka mai kyau da saukarren kwayoyi, tabbatar da saukarren aiki ta daidai.

• Yi Aiki: Yara aiki na gate leakage test, fadada samun jirgin gate kafin raketa bayanan kwayoyin leakage.

• Bincike Bayanan: Amfani da software na aiki don bincike bayanan, gina reports, da kuma karshen tsari.

4. Amfani Da Oscilloscope Da Differential Probes

Don wasu fannin inganci, ya kamata amfani da oscilloscope da differential probes don karamin kwayoyin gate leakage.

Hanyoyi:

• Yadda ake Yi Kirkiro Kirkiro: Saki oscilloscope da differential probes zuwa gate da source na DUT.

• Gargadi Oscilloscope: Tabbatar da time base da vertical scale na oscilloscope don karamin kwayoyi masu kadan.

• Samun Jirgin Tsari: Amfani da jirgin kwayoyi na kan waɗanda ba a cikin aiki na karamin kwayoyi don samun jirgin gate da ya kamata.

• Tafiya Alama: Tafiya alama a cikin oscilloscope kafin raketa bayanan kwayoyin gate leakage.

5. Muhimman Abubuwa

• Nemi Ingantaccen Tsarin: Idan kana karamin gate leakage, yanayin nemi tsari da adadin lafiya, domin hakan suna iya haɗa da amsa.

• Jirgin Interference: Don kawo kwayoyin interference mai zaman lafiya, amfani da kabeli masu jirgin kafin kudaden da kuma boxes masu jirgin.

• Calibrate Equipment: Calibrate kirkiro kirkiro don tabbatar da amsa da daidaita.

• Bayyana Nau'ukan Electrostatic: Idan kana yi aiki da abubuwan da suka da shi da sensitivity, amfani da ayyuka masu bayyana nau'ukan electrostatic (kamar wearing an anti-static wrist strap) don bayyana nau'ukan electrostatic.

6. Muhimman Muhimmanci

• Testing MOSFET: Karamin kwayoyin gate leakage na MOSFETs don bincike zan iya amfani da shi da tattalin bayanai.

• Testing Integrated Circuit: A cikin designing da manufacturing chips, karamin kwayoyin gate leakage don tabbatar da quality na process.

• Testing High-Voltage Equipment: A cikin fannin karamin tsari, karamin kwayoyin gate leakage don tabbatar da safe operation na equipment.

Ta hanyar amfani da hanyoyi da kiyoyi na, za a iya karamin kwayoyin gate leakage daidai, kuma bincike tattalin bayanai da zan iya amfani da shi na device.